The three diffractometers include the rare Alpha-1 which has an incident beam Johannsson monochromator, the MPD which as two high temperature furnaces and a rapid, 15-sample sample changer, and lastly the MRD with a 4-circle goniometer, incident and diffracted beam multilayer optics, incident beam bartells monochromator, poly and monocapillary optics, and triple axis diffracted beam monochromator. The functionality of the instruments is greatly multiplied by PANalytical?s revolutionary ?PREFIX? optics system whereby instrument optics may be reconfigured with little more than a turn of a set screw, and an instrument may be changed from diverging beam optics to parallel beam optics in less than 5 minutes, while still being completely aligned. The extensive range of measurements that can be performed from these instruments range from phase identification, crystal structure refinement, diffraction peak profile analysis, thermal expansion analysis, unit cell refinement, quantitative analysis, high temperature diffraction, texture and pole figure analysis.
For thin film materials pole figure analysis can be used to determine orientation relationships between substrates and deposited materials. In this Ultima IV example in-plane pole figures were collected on both the Pt substrate and (Pb,La)TiO3/Pt/MgO PLT thin layer. The epitaxial relationship between the substrate and layer material is clearly shown. Critical to this measurement is the in-plane geometry which allows full pole figures to be collected on both the substrate and thin layer.