What does DFCT stand for?
DFCT stands for Design for Current Testability
This definition appears very rarely
Samples in periodicals archive:
IDDQ is very useful in detecting some defects that can escape functional and delay tests, however, we show that some defects in domino logic cannot be detected by either voltage or current measurements. A design-for-current-testability (DFCT) modification for dynamic logic is presented and shown to enable detection of these defects. The DFCT circuitry is designed with a negligible performance impact during normal operation.
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Clock switching: A new design for current testability (DcT) method for dynamic logic circuits (1998) by R Rosing, A M D Richardson, Y E Aimine, H G Kerkhoff, A J Acosta.
Using an Iddq test methodology on circuits with dynamic logic tends to be problematic, mainly due to charge leakage related problems. A new Design for current Testability (DcT) method has been developed, which overcomes these problems by switching the circuit into a static mode during test. The method referred to as clock switching is applicable to both domino logic and True Single-Phase Clock (TSPC) circuits.